Statistical prediction of inclusion sizes in clean steelsATKINSON, H. V; SHI, G; SELLARS, C. M et al.Materials science and technology. 2000, Vol 16, Num 10, pp 1175-1180, issn 0267-0836Conference Paper

Optimization of the illuminating beam size of an optical textile defect inspecting systemYAU, H.-F; CHEN, P.-W; WANG, N. C et al.Measurement science & technology (Print). 1998, Vol 9, Num 6, pp 960-966, issn 0957-0233Article

Defect size distribution in VLSI chipsGLANG, R.IEEE transactions on semiconductor manufacturing. 1991, Vol 4, Num 4, pp 265-269, issn 0894-6507Article

Yield prediction using critical area analysis with inline defect dataZHOU, Carl; ROSS, Ron; VICKERY, Carl et al.ASMC proceedings. 2002, pp 82-86, issn 1078-8743, isbn 0-7803-7158-5, 5 p.Conference Paper

Harp Test Structure to electrically determine size distributions of killer defectsHESS, C; WEILAND, L. H.IEEE transactions on semiconductor manufacturing. 1998, Vol 11, Num 2, pp 194-203, issn 0894-6507Conference Paper

Failure criterion of a solid with a hierarchy of defects of the same physical typeSTEPANOV, A. K.Theoretical and applied fracture mechanics. 1998, Vol 29, Num 3, pp 219-222, issn 0167-8442Article

The improved voltage life characteristics of EHV XLPE cablesFUKUI, T; HIROTSU, K; UOZUMI, T et al.IEEE transactions on power delivery. 1999, Vol 14, Num 1, pp 31-38, issn 0885-8977Article

A probabilistic fracture mechanics assessment method based on the R6 procedureXING, J; ZHONG, Q. P; HONG, Y. J et al.International journal of pressure vessels and piping. 1997, Vol 73, Num 2, pp 161-163, issn 0308-0161Article

Development of the leak-before-break assessment method to reduce some shortcomingsZHOU, J.-Q; SHEN, S.-M.International journal of pressure vessels and piping. 1996, Vol 69, Num 1, pp 75-77, issn 0308-0161Article

Pulse propagation on a fractal network. II: The effect of localized perturbationsNELSON, T. R.Physica. D. 1992, Vol 55, Num 1-2, pp 84-98, issn 0167-2789Article

Characterisation of equivalent initial flaw sizes in 7050 aluminium alloyMOLENT, L; SUN, Q; GREEN, A. J et al.Fatigue & fracture of engineering materials & structures (Print). 2006, Vol 29, Num 11, pp 916-937, issn 8756-758X, 22 p.Article

On the strength of materials with small defectsPETROV, Yu. V; SMIRNOV, V. I.Mechanics of solids. 2006, Vol 41, Num 4, pp 130-141, issn 0025-6544, 12 p.Article

Heat losses and 3D diffusion phenomena for defect sizing procedures in video pulse thermographyLUDWIG, N; TERUZZI, P.Infrared physics & technology. 2002, Vol 43, Num 3-5, pp 297-301, issn 1350-4495, 5 p.Article

Growth kinetics of disk-shaped extended defects with constant thicknessDUNHAM, S. T.Applied physics letters. 1993, Vol 63, Num 4, pp 464-466, issn 0003-6951Article

Defining defect specifications to optimize photomask production and requalificationFIEKOWSKY, Peter.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 63493R.1-63493R.8, issn 0277-786X, isbn 0-8194-6444-9, 2VolConference Paper

Sizing of cracks using the alternating current field measurement techniqueLETESSIER, R; COADE, R. W; GENEVE, B et al.International journal of pressure vessels and piping. 2002, Vol 79, Num 8-10, pp 549-554, issn 0308-0161, 6 p.Conference Paper

Defect printability measurement on the KLA-351 : Correlation to defect sizing using the AVI metrology systemFIEKOWSKY, P; SELASSIE, D.SPIE proceedings series. 1999, pp 754-759, isbn 0-8194-3468-X, 2VolConference Paper

Molecular dynamics investigation of dislocation pinning by a nanovoid in copperHATANO, Takahiro; MATSUI, Hideki.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 9, pp 094105.1-094105.8, issn 1098-0121Article

CD error Sensitivity to sub-killer defects at k₁ near 0.4 part IINAKAGAWA, K. H; FUNG CHEN, J; SOCHA, R et al.SPIE proceedings series. 1999, pp 893-904, isbn 0-8194-3468-X, 2VolConference Paper

Dependence of defects in optical lithographyHAM, Y. M; HUR, I. B; KIM, Y. S et al.Japanese journal of applied physics. 1992, Vol 31, Num 12B, pp 4137-4142, issn 0021-4922, 1Article

An Open-Architecture approach to Defect Analysis Software for Mask Inspection SystemsPEREIRA, Mark; PAI, Ravi R; MOHAN REDDY, Murali et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7379, issn 0277-786X, isbn 978-0-8194-7656-2 0-8194-7656-0, 1Vol, 737927.1-737927.8Conference Paper

Study of ADI(after develop inspection) using electron beamSAITO, Misako; HAYASHI, Teruyuki; FUJIHARA, Kaoru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6195-4, 2Vol, vol 2, 615248.1-615248.8Conference Paper

Evaluation de la qualité des soudures vis-à-vis de la résistance à la fatigue = Weld quality assessment with regard to fatigue strengthLIEURADE, H. P; HUTHER, I; LEBAILLIF, D et al.Mécanique & industries. 2005, Vol 6, Num 2, pp 133-143, issn 1296-2139, 11 p.Article

Diagnosis of hold time defectsZHIYUAN WANG; MAREK-SADOWSKA, Malgorzata; TSAI, Kun-Han et al.IEEE International Conference on Computer Design. 2004, pp 192-199, isbn 0-7695-2231-9, 1Vol, 8 p.Conference Paper

Inspecting alternating phase shift masks by matching stepper conditionsHEMAR, Shirley; ROSENBUSCH, Anja.SPIE proceedings series. 2003, pp 113-118, isbn 0-8194-5018-9, 6 p.Conference Paper